Patterns and reliability of EEG during error monitoring for internal versus external feedback in schizophrenia

Publication date: Available online 7 May 2016
Source:International Journal of Psychophysiology
Author(s): Katiah Llerena, Jonathan K. Wynn, Greg Hajcak, Michael F. Green, William P. Horan
BackgroundAccurately monitoring one's performance on daily life tasks, and integrating internal and external performance feedback are necessary for guiding productive behavior. Although internal feedback processing, as indexed by the error-related negativity (ERN), is consistently impaired in schizophrenia, initial findings suggest that external performance feedback processing, as indexed by the feedback negativity (FN), may actually be intact. The current study evaluated internal and external feedback processing task performance and test-retest reliability in schizophrenia.Methods92 schizophrenia outpatients and 63 healthy controls completed a flanker task (ERN) and a time estimation task (FN). Analyses examined the ΔERN and ΔFN defined as difference waves between correct/positive versus error/negative feedback conditions. A temporal principal component analysis was conducted to distinguish the ΔERN and ΔFN from overlapping neural responses. We also assessed test-retest reliability of ΔERN and ΔFN in patients over a 4-week interval.ResultsPatients showed reduced ΔERN accompanied by intact ΔFN. In patients, test-retest reliability for both ΔERN and ΔFN over a four-week period was fair to good.ConclusionIndividuals with schizophrenia show a pattern of impaired internal, but intact external, feedback processing. This pattern has implications for understanding the nature and neural correlates of impaired feedback processing in schizophrenia.



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